Categories:
1. Section + microscopic observation (OM, SEM, TEM)
2. Mechanical/electrical/thermal/chemical properties analysis of materials
3. Surface micro-area analysis
4. Foreign matter/contamination analysis
5. Component analysis
6. Material aging and reliability analysis
Surface material analysis methods:
1. AES Auger electron spectrometer application
2. AFM application
3. EELS electronic energy loss analyzer applications
4. FT-IR application of Fourier infrared microscope
5. SEM/EDS scanning electron microscope/X-ray energy spectrometer application
6. SIMS secondary ion Spectrometer (special fixed point/non-fixed point sample preparation, elemental analysis)
7. TEM Transmission electron microscopy (fixed-point/non-fixed-point sample preparation and on-board observation)
8. Application of TOF-SIMS time-of-flight secondary ion mass spectrometry
9. Application of XPS X-ray photoelectron spectrometer
